Researchers Reach Femtogram-Level Chemical Characterization

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ePT--the Electronic Newsletter of Pharmaceutical Technology

Combining atomic force microscopy and infrared spectroscopy, scientists at the University of Illinois have demonstrated a method for simultaneous structural and chemical characterization of samples at the femtogram (10-15g) level.

Champaign, IL (Mar. 27)-Combining atomic force microscopy and infrared spectroscopy, scientists at the University of Illinois have demonstrated a method for simultaneous structural and chemical characterization of samples at the femtogram (10-15g) level.

Their technique is based on a silicon cantilever probe in an atomic force microscope. The probe integrates a heater-thermometer that is controlled in the 25–1000 °C temperature range, which allows extraction of very small samples of material for imaging. To analyze a sample, the heater temperature is raised to slightly above the melting point of the sample material. The material is then analyzed by Raman or Fourier transform infrared (FTIR) spectroscopic imaging.

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“We anticipate this approach will help bridge the gap between nanoscale structural analysis and conventional molecular spectroscopy in a manner widely useful to most analytical laboratories,” said William P. King, professor of mechanical science and engineering at the University of Illinois.