- Pharmaceutical Technology-09-02-2016
- Volume 40
- Issue 9
Data Logger Provides Ultra-Low Temperature Readings
The OM-CP-CRYO-TEMP ultra-low temperature data logger from Omega Engineering records temperatures as low as -86 °C.
The OM-CP-CRYO-TEMP ultra-low temperature data logger from Omega Engineering records temperatures as low as -86 °C. The logger is a stand-alone device and does not require any additional probes. The enclosure is designed with a handle for easy attachment and is IP65 splash resistant. The logger uses a USB docking station to communicate with a personal computer or laptop. The OM-CP-CRYO-TEMP provides date-and-time stamped temperature readings. Using Omega’s software, the user can view the data in graphical or tabular form. High and low alarm limits and high and low warning limits can be programmed through the software. The user can set the alarm limits in the range required, and the warning limits can be set to alert the user when the temperature is nearing a high or low alarm limit, so that proper action can be taken to ensure the integrity of the goods. The logger is also equipped with three LED lights: a green LED that blinks while the recorder is logging data, a yellow LED that blinks when the temperature has breached the warning limits, and a red LED that blinks when the temperature alarm limits have been exceeded.
Articles in this issue
almost 10 years ago
The Internet of Things for Pharmaceutical Manufacturingalmost 10 years ago
How to Get the Most Out of Facility Renovationsalmost 10 years ago
Root Cause Analysis–Finding the Root of the Problemalmost 10 years ago
New Directions in Modular Manufacturingalmost 10 years ago
Efforts Accelerate to Streamline Postapproval Change Processalmost 10 years ago
Common Deficiencies in ANDAs for Dermatologic Drug Productsalmost 10 years ago
Maintaining Hygienic Diaphragm Valvesalmost 10 years ago
Tumble Blenders Include Improved Safety Featuresalmost 10 years ago
Analyzer Automates Cell-Culture Chemistry Analysisalmost 10 years ago
Liquid Handling System for Automatic Particle Characterization