The authors describe how a combination of imaging techniques can be used to provide topographic and chemical information to characterize a sample.
Olfa Hollricher
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Olfa Hollricher, WiTec GmbH
Articles by Olfa Hollricher
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Characterization with Atomic Force Microscopy, Topographic, and 3D RamanPublished: July 15th 2013 | Updated:
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