ED-XRF Spectrometers Offer Rapid Elemental Analysis

SPECTRO XEPOS spectrometers from SPECTRO Analytical Instruments feature energy dispersive X-ray fluorescence (ED-XRF) technology for multi-elemental analysis of major, minor, and trace element concentrations. The analyzers are designed to handle critical tasks including rapid screening elemental analysis and support product quality control at-line for a variety of applications including the manufacture of pharmaceuticals.

The spectrometers feature innovations in adaptive excitation plus tube and detector technologies to improve sensitivity by 10´ or more to boost precision, realize lower detection levels, and analyze of a range of elements. The TurboQuant II software analyzes unknown liquids, powders, or solid samples.

The spectrometers remain powered on between measurements to prevent on/off variations from affecting readings and ensure long-term stability.

Optional AMECARE M2M machine-to-machine support extends the analyzers’ self-diagnostic functions with proactive alerts, backed up by direct connection with a remote SPECTRO service  PC.

Four versions are available, enabling users to prioritize their selection according to measurement speed, precision, or groups of targeted elements in specific matrices.

Source: Ametek SPECTRO